Semiconductor encapsulation and method thereof

ABSTRACT

A semiconductor encapsulation comprises a lead frame further comprising a chip carrier and a plurality of pins in adjacent to the chip carrier. A plurality of grooves opened from an upper surface of the chip carrier partially dividing the chip carrier into a plurality of chip mounting areas. A bottom portion of the grooves is removed for completely isolate each chip mounting area, wherein a width of the bottom portion of the grooves removed is smaller than a width of the grooves. In one embodiment, a groove is located between the chip carrier and the pins with a bottom portion of the groove removed for isolate the pins from the chip carrier, wherein a width of the bottom of the grooves removed is smaller than a width of the grooves.

TECHNICAL FIELD

This invention relates to a semiconductor encapsulation and methodthereof, in particular to a power semiconductor encapsulation and methodthereof.

BACKGROUND TECHNOLOGIES

Encapsulation is of vital importance to power semiconductor chips, whichnot only plays the role of protecting the chips and enhancing the heatconduction performances, but also provides an interface to communicatethe internal worlds of the chips with external circuits. Currentlycontinuous increasing scale of chip manufacture as well as thetremendous and rapidly growing electronic device market drives thegrowth of the semiconductor encapsulation industry. In order to meet thedemands of light weight and compact products, various encapsulationstructures are renewed; wherein chip encapsulation methods capable ofsatisfying the light weight and compact as well as high current densityrequirement receive more serious considerations.

As shown in FIG. 1, the existing encapsulation of a power semiconductorchip includes pins 1, chip carrier 2, bonding adhesive 3, chip 4, bondwire 5 and a plastic package body 6; wherein the chip carrier 2 and thepins are disconnected at the beginning of the encapsulation processwhere a gap is kept between the chip carrier 2 and the pins 1. Duringthe encapsulation process of the chip, the chip carrier 2 and the pins 1are arranged on chip mounting equipment. The bonding adhesive isdisposed on the chip carrier 2, and then the chip 4 is pressed on thebonding adhesive 3. The squeezing effect of the chip 4 to the bondingadhesive 3 causes aggravation of the bonding adhesive 3 to overflow tothe surrounding area of the chip 4, and the bonding adhesive 3 couldeven drip down onto the chip mounting equipment from the gap between thechip carrier 2 and the pins 1 to contaminate the chip mountingequipment.

In the existing art of multiple chips co-package, at the beginning ofencapsulation process, the chip mounting areas are disconnected fromeach other in addition to the fact that the chip carrier and the pinsare disconnected. A gap is kept between the chip mounting areas. FIG.2A-2C are schematic cross sections of a metal clip semiconductorencapsulation with multiple chips in prior art. The structure comprisespins 1′, chip carrier 2′ with two chip mounting areas, bonding adhesive3′, chips 4′ and connection metal clips 5′. As shown in FIG. 2A a gap d1is kept between the chip mounting areas of chip carrier 2′ and a gap d2is also kept between the chip carriers 2′ and the pins 1′. As shown inFIG. 2B, when the size of the chips 4′ is increased with the chipcarriers 2′ remains the same size, the bonding adhesive 3′ below thechips 4′ could overflow to the edges of the chip carrier 2′. As shown inFIG. 2C, the bonding adhesive 3′ could even flow into the gap betweenthe chip carriers 2′, as well as the gap between the chip carriers 2′and the pins 1′ to contaminate the chip mounting equipment. Therefore,during actual manufacturing process, in order to avoid the contaminationon the chip mounting equipment caused by the overflowing of the bondingadhesive, mounting distance margin requirements are regulated based ondifferent bonding adhesive, representing reducing the area of the chipsunder the premise of a set encapsulation size, or increasing theencapsulation size under the premise of a fix chip areas. However, themeasure greatly reduces the utilization rate of the chip size in thesemiconductor encapsulation.

SUMMARY OF INVENTION

A primary goal of this invention is to provide a power semiconductorchip encapsulation structure and method that would effectively preventcontamination to the chip mounting equipment caused by the overflow ofbonding adhesive when mounting the chips at the same time maximize theutilization rate of chip sizes in the encapsulation body.

Specifically the invention provides a metal clip semiconductorencapsulation comprises:

a lead frame comprising a chip carrier and a plurality of pins inadjacent to the chip carrier; an upper surface of the chip carrier beingprovided with a first groove dividing the chip carrier into a first chipmounting area and a second chip mounting area;

a first semiconductor chip having a bottom electrode and a plurality oftop electrodes disposed on the first chip mounting area, with its bottomelectrode mounted onto the first chip mounting area through a firstadhesive, wherein an excessive amount of the first adhesive accumulatedat a bottom corner of the first groove near the first chip mountingarea;

a second semiconductor chip having a bottom electrode and a plurality oftop electrodes disposed on the second chip mounting area, with itsbottom electrode mounted onto the second chip mounting area through asecond adhesive;

a first metal clip having a first end and a second end, wherein thefirst end of the first metal clip connecting to a top electrode of thefirst semiconductor chip, wherein the second end of the first metal clipdisposed inside the first groove; and

a plastic package for encapsulation of the chip carrier, the pins, thefirst and second semiconductor chips and the first metal clip.

In one embodiment a bottom of the first groove is removed to isolate thefirst chip mounting area from the second chip mounting area, a width ofthe first groove bottom removed is substantially smaller than a width ofthe first groove.

In another embodiment an excessive amount of the second adhesiveaccumulated at a bottom corner of the first groove near the second chipmounting area

In another embodiment the second end of the first metal clip is disposedinside the first groove close to the second chip mounting area andelectrically connected to the second chip mounting area.

In another embodiment the lead frame further comprises a second groovedisposed between the chip carrier and at least one of the plurality ofthe pins, a bottom portion of the second groove being removed forelectrically separating the at least one of the plurality of the pinsfrom the chip carrier, wherein a width of the second groove bottomremoved being substantially smaller than a width of the second groove.

In another embodiment the package further comprises a second metal clip,wherein a first end of the second metal clip connecting to a topelectrode of the second chip and a second end of the second metal clipdisposed inside the second groove electrically connecting to the atleast one of the plurality of the pins.

In another embodiment an excessive amount of the second adhesiveaccumulates at a bottom corner of the second groove near the second chipmounting area.

The invention further provides a semiconductor encapsulation comprises:

a lead frame comprising a chip carrier and a plurality of pins;

a first groove disposed between the chip carrier and at least one of theplurality of the pins, wherein a bottom portion of the first groovebeing removed for electrically separating the at least one of theplurality of the pins from the chip carrier, wherein a width of thefirst groove bottom removed being substantially smaller than a width ofthe first groove;

a first semiconductor chip disposed on the chip carrier having a bottomelectrode and a plurality of top electrodes, wherein the bottomelectrode of the first semiconductor chip connected to the chip carrierthrough a first conductive adhesive;

a metal connection connecting a top electrode of the first semiconductorchip to the at least one of the plurality of the pins; and

a plastic package for encapsulating the chip carrier, the pins, the chipand the metal connection.

In one embodiment an excessive amount of the second adhesive accumulatedat a bottom corner of the first groove near the second chip mountingarea.

In another embodiment an upper surface of the chip carrier is providedwith a second groove dividing the chip carrier into a first chipmounting area and a second chip mounting area. A bottom of the secondgroove is removed to isolate the first chip mounting area from thesecond chip mounting area, wherein a width of the second groove bottomremoved is substantially smaller than a width of the second groove.

In another embodiment the first semiconductor chip disposed on the firstchip mounting area with its bottom electrode mounted onto the first chipmounting area through a first adhesive, wherein an excessive amount ofthe first adhesive accumulated at a bottom corner of the first groovenear the first chip mounting area.

In another embodiment a second semiconductor chip having a bottomelectrode and a plurality of top electrodes disposed on the second chipmounting area, with its bottom electrode mounted onto the second chipmounting area through a second adhesive.

In another embodiment semiconductor package further comprises a metalclip having a first end and a second end, wherein the first end of thesecond metal clip connecting to a top electrode of the secondsemiconductor chip and the second end of the second metal clip disposedinside the second groove electrically connecting to the first chipmounting area.

In another embodiment a metal clip having a first end and a second end,wherein the first end of the metal clip connecting to a top electrode ofthe first semiconductor chip and the second end of the metal clipdisposed inside the first groove.

The invention further provides a semiconductor encapsulation methodcomprises the following steps:

Step 1: providing a lead frame comprising a chip carrier and a pluralityof pins in adjacent to the chip carrier with a first groove open from atop surface of the lead frame to a depth shallower than a thickness ofthe lead frame located between the chip carrier and at least one of theplurality of the pins;

Step 2: disposing a first semiconductor chip having a bottom electrodeand a plurality of top electrodes on the chip carrier, connecting thebottom electrode of the first semiconductor chip to the chip carrierthrough a first conductive adhesive;

Step 3: providing a first metal connection connecting a top electrode ofthe first semiconductor chip to the at least one of the plurality of thepins

Step 4: providing a plastic package for encapsulating the chip carrier,the pins, the first semiconductor chip and the metal connection; and

Step 5: removing a bottom portion of the first groove so as toelectrically isolate the at least one of the plurality of the pins fromthe chip carrier.

In one embodiment in Step 2 an excessive amount of the first adhesiveaccumulated at a bottom corner of the first groove near the chipcarrier.

In another embodiment the step of providing a metal connection in Step 3further comprises connecting a first end a first metal clip to a topelectrode of the first semiconductor chip and a second end of the firstmetal clip to the at least one of the plurality of the pins, wherein thesecond end of the first metal clip being disposed inside the firstgroove.

In another embodiment in Step 1 the chip carrier is provided with asecond groove on an upper surface of the chip carrier dividing the chipcarrier into a first chip mounting area and a second chip mounting area.

In another embodiment in Step 2 the first semiconductor chip disposed onthe first chip mounting area with its bottom electrode mounted onto thefirst chip mounting area through a first adhesive, an excessive amountof the first adhesive accumulates at a bottom corner of the first groovenear the first chip mounting area.

In another embodiment Step 2 further comprises disposing a secondsemiconductor chip having a bottom electrode and a plurality of topelectrodes on the second chip mounting area, with its bottom electrodemounted onto the second chip mounting area through a second adhesive,wherein an excessive amount of second adhesive accumulated at a bottomcorner of the second groove near the second chip mounting area.

In another embodiment Step 3 further provides a second metal connectioncomprising a metal clip with a first end, connecting to a top electrodeof the second chip and a second end disposed inside the second groove.

In another embodiment Step 5 further comprises a step of removing abottom of the second groove so as to electrically isolate the first chipmounting area from the second chip mounting area, wherein a width of thesecond groove bottom removed is substantially smaller than a width ofthe second groove.

The invention further provides a metal clip semiconductor encapsulationmethod comprises the following steps:

Step 1: providing a lead frame comprising a chip carrier and a pluralityof pins, the chip carrier is provided with a first groove open from atop surface of the lead frame to a depth shallower than a thickness ofthe lead frame dividing the chip carrier into a first chip mounting areaand a second chip mounting area; the pins are arranged in adjacent tothe chip carrier;

Step 2: disposing a first semiconductor chip having a bottom electrodeand a plurality of top electrodes on the first chip mounting area withits bottom electrode mounted onto the first chip mounting area through afirst adhesive, wherein an excessive amount of the first adhesiveaccumulated at a bottom corner of the first groove near the first chipmounting area;

disposing a second semiconductor chip having a bottom electrode and aplurality of top electrodes on the second chip mounting area with itsbottom electrode mounted onto the second chip mounting area through asecond adhesive;

Step 3: providing a first metal clip having a first end and a secondend, connecting the first end of the first metal clip onto a topelectrode of the first semiconductor chip and the second end of thefirst metal clip to the second chip mounting area, wherein the secondend of the first metal clip disposed inside the first groove;

Step 4: providing a plastic package for encapsulating the chip carrier,the pins, the first and second chips and the first metal clip.

Step 5: removing a bottom of the first groove so as to electricallyisolate the first chip mounting area from the second chip mounting area,wherein a width of the first groove bottom removed is substantiallysmaller than a width of the first groove.

In one embodiment Step 2 further comprises a step of accumulating anexcessive amount of the first adhesive at a bottom corner of the firstgroove near the first chip mounting area.

In another embodiment in Step 1 the lead frame is provided with a secondgroove disposed between the chip carrier and at least one of theplurality of the pins; wherein Step 3 further comprising a step ofproviding a second metal clip with a first end and a second end, whereinthe first end of the second metal clip connecting to a top electrode ofthe second semiconductor chip and the second end of the second metalclip electrically connecting to the at least one of the plurality of thepins, wherein the second end of the second metal clip being disposedwithin the second groove.

In another embodiment Step 5 further comprises a step of removing abottom of the second groove so as to electrically isolate the at leastone of the plurality of the pins from the chip carrier, wherein a widthof the second groove bottom removed being substantially smaller than awidth of the second groove.

BRIEF DESCRIPTION OF DRAWINGS

FIG. 1 is a cross-sectional view of a current semiconductorencapsulation structure.

FIG. 2A-2C are the cross-sectional views of cut Tent semiconductorencapsulation structure with multiple chips co-package for explaininglimitation on a chip size in prior art.

FIG. 3 is a flow chart for a metal clip semiconductor encapsulationmethod of Embodiment 1.

FIGS. 4A and 4B are a top view and a cross-sectional view of a leadframe provided in Embodiment 1.

FIGS. 5A and 5B are a top view and a cross-sectional view of arrangingthe chips on the lead frame through bonding adhesive in Embodiment 1.

FIGS. 6A and 6B are a top view and a cross-sectional view of using metalclip to link the chip electrodes in Embodiment 1.

FIGS. 7A and 7B are a top view and a cross-sectional view of using thebond wire to link the chip electrodes and the pins in Embodiment 1.

FIGS. 8A and 8B are a top view and a cross-sectional view plasticallypackaged by the plastic package body in Embodiment 1.

FIGS. 9A and 9B are a top view and a cross-sectional view of cutting offthe bottom surface of the carrier groove at the bottom of the plasticpackage body in Embodiment 1.

FIG. 10 is a flow chart of the metal clip semiconductor encapsulationmethod of Embodiment 2.

FIGS. 11A and 11B are a top view and a cross-sectional view of the leadframe provided in Embodiment 2.

FIGS. 12A and 12B are a top view and a cross-sectional view of arrangingthe chips on the lead frame in Embodiment 2.

FIGS. 13A and 13B are a top view and a cross-sectional view of usingmetal clip to link the chip electrodes and the pins in Embodiment 2.

FIGS. 14A and 14B are a top view and a cross-sectional view of using thebond wire to link the chip electrodes and the pins in Embodiment 2.

FIGS. 15A and 15B are a top view and a cross-sectional view of aplastically encapsulation package body in Embodiment 2.

FIGS. 16A and 16B are a top view and a cross-sectional view of removinga bottom portion of the groove at the bottom of the plastic package bodyin Embodiment 2.

FIG. 17 is the cross-sectional view of a metal clip semiconductorencapsulation structure of Embodiment 3.

DETAILED DESCRIPTION OF SPECIFIC EMBODIMENTS

Embodiment 1: this invention provides a metal clip encapsulation method.The encapsulation structure of the encapsulation method includes a leadframe 110, bonding adhesive 120, chips 130 and 140, a metal clip 150,bond wires 160 and a plastic package body 170. The metal clipsemiconductor encapsulation flow chart is as shown in FIG. 3 and thespecific encapsulation process thereof is as follows:

As shown in FIGS. 4A and 4B, the lead frame 110 is provided at first andthe lead frame 110 comprises a chip carrier 115 and a plurality of pinsin adjacent to the chip carrier. FIG. 4A is a top view of the lead frameand FIG. 4B is a cross sectional view along the dotted line position inFIG. 4A. The chip carrier 115 comprises first chip mounting area 1151,second chip mounting area 1152 with a groove 1153 opened from a topsurface of the chip carrier disposed between the first and second chipmounting areas dividing the chip carrier into two chip mounting areas. Adepth of the groove 1153 is shallower than a thickness of the chipcarrier therefore the first and the second chip mounting areas are stillconnected in the bottom portion of the chip carrier. In actualapplication, a plurality of chip mounting areas can be arranged on thechip carrier and by dividing the chip carrier with a plurality ofgrooves. In the embodiment of FIGS. 4A and 4B, only two chip mountingareas and one groove on the lead frame is shown as an example. As shownin the FIG. 4A, the plurality of pins further comprises pin 111, pin112, pin 113 and pin 114; wherein the pin 111 is connected with the chipcarrier 1151, representing that the pin 111 is conductively connectedwith the bottom electrode of the chip; the pin 112, the pin 113, and thepin 114 are respectively arranged at the two sides of the chip carrierby spacing one interval, and the pins are respectively corresponding tothe electrodes of the chips.

As shown in FIGS. 5A and 5B, as only two chip mounting areas arearranged on the lead frame in the embodiment, two chips are provided.The two chips are respectively a first chip 130 and a second chip 140.In one embodiment, the first chip 130 and the second chip 140respectively are a high side metallic oxide semiconductor field effecttransistor (HS MOSFET) and a low side metallic oxide semiconductor fieldeffect transistor (LS MOSFET). The HS MOSFET and LS MOSFET respectivelyinclude a source electrode and a gate electrode at the top surface and adrain electrode at the bottom surface. The chip 130 and the chip 140 arerespectively disposed on the first chip mounting area 1151 and thesecond chip mounting area 1152 through a conductive bonding adhesive120. A conductive silver paste is preferably selected as the bondingadhesive 120. In a specific process operation, the conductive silverpaste is coated on the chip mounting areas at first and then the chipsare pressed onto the conductive silver paste. Usually, the conductivesilver paste shall overflow on the chip mounting areas; in particularafter the chips are disposed on the conductive silver paste, the gravityof the chips shall aggravate the overflowing of the conductive silverpaste. In the embodiment, as shown in FIGS. 5A and 5B, the conductivesilver paste shall slowly overflow and flow into the groove 1153accumulated at the bottom corners near the chips respectively. This isdifferent from the prior art in which the chip mounting areas aredisconnected, the conductive silver paste would overflow from the chipmounting areas and pass through the gaps between the mounting areas tocontaminate the chip mounting equipments supporting the lower surface ofthe lead frame, therefore a distance between the edges of the chips andthe edges of the chip mounting areas must be maintained, which limitsthe chip size for a given encapsulation sizes. In this embodiment, thebottom corners of the grooves between the chip mounting areas collectoverflowed bonding adhesive and prevent the bonding adhesive fromflowing onto the chip mounting equipments; the distance from the edgesof the chips to the edges of the chip mounting areas can be greatlyreduced, from more than 8-10 mils in traditional lead frame, to lessthan 3 mils. Therefore, the utilization rate of the chip size to theencapsulation body size of this invention is significantly improved.Alternatively, the first chip may be bonded onto the first chip mountingarea by a first bonding adhesive with an excessive amount of the firstbonding adhesive accumulated at the bottom corner of the groove near thefirst chip mounting area and the second chip may be bonded to the secondmounting area by a second bonding adhesive with an excessive amount ofthe second bonding adhesive accumulated at the bottom corner of thegroove near the second chip mounting area.

As shown in FIGS. 6A and 6B, after the chips are arranged on the chipmounting areas, one metal clip 150 is provided; a first end 1501 of themetal piece 150 is arranged on the source electrode at the top of thefirst chip 130 and a second end 1502 of the metal clip is disposed at aposition in the carrier groove 153 near the second chip 140. In theprior art encapsulation method shown in FIGS. 2A-2C, as no carriergrooves are provided, the second end 1502 of the metal clip and thesecond chip 140 must share the same second chip mounting area 1152. Inorder to prevent the bonding adhesive at the lower part of the secondend 1502 of the metal clip 150 and the bonding adhesive at the lowerpart of the second chip 140 from piling up due to overflowing, and evenaffecting the circuit performance on the surface of the chip due to theclimbing effect of the bonding adhesive surface tension, a certaindistance is required between the second end 1502 of the metal clip 150and the second chip 140. However, in this embodiment, the second end1502 of the metal clip is disposed inside the carrier groove 1153 whichhas a certain depth; moreover, with the height of the second chip 140,the possibility that the circuit performances affected by the bondingadhesive climbing onto the surface of the second chip 140 from the lowerpart of the second end 1502 of the metal clip and from the lower part ofthe second chip 140 is greatly reduced. Therefore, the distance betweenthe second end 1502 of the metal clip and the second chip 140 can beshortened and the distance between the first chip 130 and the secondchip 140 can also be shortened. In one embodiment, the distance from theedge of the first chip to the edge of the second chip is reduced toabout 5 mils; while in the traditional encapsulation of FIG. 2A-2C, thedistance from the edge of the first chip to the edge of the second chipmust be more than 20 mils; thus, the groove structure in this embodimentimproves the utilization rate of the chips size in the encapsulationbody size and saves cost through the reduction of molding material usedin later step. In one embodiment the second end of the clip reaches theedge of the second chip mounting area defining the groove, in anotherembodiment the second end of the clip remains a distance from the edgeof the second chip mounting area defining the groove.

As shown in FIGS. 7A and 7B, a bond wires 160 are provided to connectthe other chip electrodes; the first chip 130 and the pin 111 areconductively connected; the gate electrode at the top of the first chip130 is connected to the pin 113 through the bond wire 160; the sourceelectrode at the top of the second chip 140 is connected to the pin 112through the bond wire 160; and the gate electrode at the top of thesecond chip 140 is connected with the pin 114 through the bond wire 160.

As shown in FIGS. 8A and 8B, after the bond wire connection is finished,a plastic package body 170 is adopted to implement encapsulation on theencapsulation structure.

As shown in FIGS. 9A and 9B, after the encapsulation is finished, abottom portion of the carrier groove 1153 is removed from the bottom ofthe plastic package body 170 by cutting off or by etching, therebyelectrically isolate the first chip mounting area 1151 and the secondchip mounting area 1152 so as to finish the encapsulation of chips.Preferably a width of the bottom portion of the carrier groove removedis smaller than a width of the groove itself for leaving space toaccommodate the second end 1502 of the clip 150 inside the groove andelectrically connecting to the second chip mounting area.

Embodiment 2: this invention provides a metal clip encapsulation method.The encapsulation structure includes a lead frame 210, bonding adhesive220, a chip 230, a metal clip 240, a bond wire 250 and a plastic packagebody 260. The flow chart of the semiconductor encapsulation method flowchart is as shown in the FIG. 10 and the specific encapsulation stepthereof is as follows:

As shown in FIGS. 11A and 11B, the lead frame 210 comprises a pluralityof pins and a chip carrier 211. The pins include two groups of pins 212and 213 which are connected together with the chip carrier 211 and arerespectively disposed at two opposite sides of the chip carrier 211. Apin 214 is disconnected from the chip carrier 211. As shown in the FIG.11B, a groove 215 is disposed on top surface of the lead frame betweenthe chip carrier 211 and the pin 213 dividing the chip carrier 211 andthe pin 213 on the top portion of the lead frame. A depth of the groove215 is shallower than a thickness of the lead frame therefore the chipcarrier 211 and the pin 213 are connected at the bottom portion of thelead frame.

As shown in FIGS. 12A and 12B, one chip 230 is provided; the chip 230 isdisposed on the chip carrier 211 through bonding adhesive 220; theoverflowed bonding adhesive 220 can flow into the groove 215accumulating at the bottom corner near the chip carrier, therebyavoiding the contamination to the chip mounting equipment. The edge ofthe chip 230 can also approach to the edge of the chip carrier 211 asclose as possible. In one embodiment, chip 230 is a power metallic oxidesemiconductor field effect transistor (MOSFET) having a source electrodeand a gate electrode on the top and a drain electrode on the bottom withthe drain bottom electrode connected to the chip carrier of the leadframe.

As shown in FIGS. 13A and 13B, the metal clip 240 is used to connect thetop electrodes of the chips and the pins; take a power metallic oxidesemiconductor field effect transistor (MOSFET) as an example, a firstend 2401 of the metal clip 240 is connected onto the source electrode atthe top of the chip and a second end 2402 of the metal clip 240 isdisposed inside the groove at a location near the pin and iselectrically connected to the pin. In one embodiment the second end ofthe clip reaches the edge of the pin defining the groove, in anotherembodiment the second end of the clip remains a distance from the edgeof the pin defining the groove. Alternatively, bond wires or ribbonwires can replace metal clip 240 to connect the source electrode on thechip top surface to the pins.

As shown in FIGS. 14A and 14B, a bond wire 250 is used to connect thegate electrode at the top of the chip 230 and the pin 214. Alternativelya second metal can be used to connect the gate of chip 230 to the pin214. As shown in FIGS. 15A and 15B, the plastic package body 260 is thenused to plastically encapsulate the lead frame, the chip, the metal clipand the pins. After the plastic package is finished as shown in theFIGS. 16A and 16B, a bottom portion of the groove 215 is removed at thebottom of the plastic package body, thereby isolating the connectionbetween the chip carrier 211 and the pin 213 so as to finish the wholeencapsulation process. In this embodiment, the chip carrier and the pinsare connected together before plastic encapsulation with a groovedisposed between the pins and the carrier protecting the chip mountingequipment from being contaminated by the bonding adhesive, therebyallows the reduction of the distance between the chip carrier and thepins and improves the utilization rate of the chip size inencapsulation.

Embodiment 3: embodiment 1 as described above utilizes a lead frame ofconnected chip mounting areas on a chip carrier partially divided by agroove before plastic encapsulation and then isolate each chip mountingarea by removing a portion of the groove bottom after the encapsulationis finished. On the other hand embodiment 2 utilize a lead frame withconnected chip carrier and pins partially divided by a groove beforeplastic encapsulation and then isolate the chip mounting area and thepins by removing a portion of the groove bottom after encapsulation.This embodiment 3 combines the features of Embodiment 1 and Embodiment2. As shown in the FIG. 17, metal clips are used to replace the bondwires to connect the chip electrodes and the pins. Multiple chipmounting areas on chip carrier 311 in the lead frame 310 and the pins312 are all connected together at the bottom portion of the lead framewith a plurality of grooves partially dividing the chip mounting areasand pins from the chip carrier. Specifically groove 313 partiallydivides the chip carrier into a first chip mounting area and a secondchip mounting area, groove 314 partially divides the carrier and thepins. After a first chip and a second chip are mounted on the first chipmounting area and the second chip mounting area respectively using afirst bonding adhesive and second bonding adhesive, excessive amount offirst bonding adhesive may be accumulated at the bottom corners ingrooves near the first chip mounting area and excessive amount of thesecond bonding adhesive may be accumulated at the bottom corners of thegrooves near the second chip mounting area. First and second clips eachhas a first end connected to a top electrode of a chip and a second enddisposed inside a groove. After plastic encapsulation, a portion of eachgroove bottom is removed to electrically isolate the chip mounting areasand the pins. A width of the bottom of the groove removed is smallerthan a width of the groove.

While the above is a complete description of the preferred embodiment ofthe present invention, it is possible to use various alternatives,modifications and equivalents. Although the specification uses MOSFETchips as an example, the package method is applicable to other types ofsemiconductor chips or their combinations with or without bottomelectrode. Therefore, the scope of the present invention should bedetermined not with reference to the above description but should,instead, be determined with reference to the appended claims, along withtheir full scope of equivalents. Any feature, whether preferred or not,may be combined with any other feature, whether preferred or not. In theclaims that follow, the indefinite article “A”, or “An” refers to aquantity of one or more of the item following the article, except whereexpressly stated otherwise. The appended claims are not to beinterpreted as including means-plus-function limitations, unless such alimitation is explicitly recited in a given claim using the phrase“means for.”

1. A metal clip semiconductor encapsulation comprises: a lead framecomprising a chip carrier and a plurality of pins in adjacent to thechip carrier; an upper surface of the chip carrier being provided with afirst groove dividing the chip carrier into a first chip mounting areaand a second chip mounting area; a first semiconductor chip having aplurality of top electrodes disposed on the first chip mounting areathrough a first adhesive, wherein an excessive amount of the firstadhesive accumulated at a bottom corner of the first groove near thefirst chip mounting area; a second semiconductor chip having a bottomelectrode and a plurality of top electrodes disposed on the second chipmounting area, with its bottom electrode mounted onto the second chipmounting area through a second adhesive; a first metal clip having afirst end and a second end, wherein the first end of the first metalclip connecting to a top electrode of the first semiconductor chip,wherein the second end of the first metal clip disposed inside the firstgroove; and a plastic package for at least partially encapsulating thechip carrier, the pins, the first and second semiconductor chips and thefirst metal clip.
 2. The metal clip semiconductor encapsulation of claim1 wherein a bottom of the first groove is removed to isolate the firstchip mounting area from the second chip mounting area, wherein a widthof the first groove bottom removed is substantially smaller than a widthof the first groove.
 3. The metal clip semiconductor encapsulation ofclaim 1, wherein an excessive amount of the second adhesive accumulatedat a bottom corner of the first groove near the second chip mountingarea.
 4. The metal clip semiconductor encapsulation of claim 1 whereinthe second end of the first metal clip is disposed inside the firstgroove close to the second chip mounting area and electrically connectedto the second chip mounting area.
 5. The metal clip semiconductorencapsulation of claim 1 further comprises a second groove disposedbetween the chip carrier and at least one of the plurality of the pins,wherein a bottom portion of the second groove being removed forelectrically separating the at least one of the plurality of the pinsfrom the chip carrier, wherein a width of the second groove bottomremoved being substantially smaller than a width of the second groove.6. The metal clip semiconductor encapsulation of claim 5 furthercomprises a second metal clip, wherein a first end of the second metalclip connecting to a top electrode of the second chip and a second endof the second metal clip disposed inside the second groove electricallyconnecting to the at least one of the plurality of the pins.
 7. Themetal clip semiconductor encapsulation of claim 5 wherein an excessiveamount of the second adhesive accumulating at a bottom corner of thesecond groove near the second chip mounting area.
 8. A semiconductorencapsulation comprises: a lead frame comprising a chip carrier and aplurality of pins; a first groove disposed between the chip carrier andat least one of the plurality of the pins, wherein a bottom portion ofthe first groove being removed for electrically separating the at leastone of the plurality of the pins from the chip carrier, wherein a widthof the first groove bottom removed being substantially smaller than awidth of the first groove; a first semiconductor chip disposed on thechip carrier having a plurality of top electrodes, wherein a bottom ofthe first semiconductor chip connected to the chip carrier through afirst adhesive; a metal connection connecting a top electrode of thefirst semiconductor chip to the at least one of the plurality of thepins; and a plastic package for encapsulating the chip carrier, thepins, the chip and the metal connection.
 9. The semiconductorencapsulation of claim 8, wherein an excessive amount of the firstadhesive accumulated at a bottom corner of the first groove near thechip carrier.
 10. The semiconductor encapsulation of claim 8 wherein anupper surface of the chip carrier is provided with a second groovedividing the chip carrier into a first chip mounting area and a secondchip mounting area.
 11. The semiconductor encapsulation of claim 10wherein a bottom of the second groove is removed to isolate the firstchip mounting area from the second chip mounting area, wherein a widthof the second groove bottom removed is substantially smaller than awidth of the second groove.
 12. The semiconductor encapsulation of claim11 wherein the first semiconductor chip disposed on the first chipmounting area with a bottom electrode mounted onto the first chipmounting area through a conductive adhesive, wherein an excessive amountof the first adhesive accumulated at a bottom corner of the first groovenear the first chip mounting area.
 13. The semiconductor encapsulationof claim 11 wherein a second semiconductor chip having a bottomelectrode and a plurality of top electrodes disposed on the second chipmounting area, with its bottom electrode mounted onto the second chipmounting area through a second adhesive.
 14. The semiconductorencapsulation of claim 11 further comprises a metal clip having a firstend and a second end, wherein the first end of the second metal clipconnecting to a top electrode of the second semiconductor chip and thesecond end of the second metal clip disposed inside the second grooveelectrically connecting to the first chip mounting area.
 15. Thesemiconductor encapsulation of claim 8 wherein the metal connectioncomprises a metal clip having a first end and a second end, wherein thefirst end of the metal clip connecting to a top electrode of the firstsemiconductor chip and the second end of the metal clip disposed insidethe first groove.
 16. A semiconductor encapsulation method comprises thefollowing steps: Step 1: providing a lead frame comprising a chipcarrier and a plurality of pins in adjacent to the chip carrier with afirst groove open from a top surface of the lead frame to a depthshallower than a thickness of the lead frame located between the chipcarrier and at least one of the plurality of the pins; Step 2: disposinga first semiconductor chip having a plurality of top electrodes on thechip carrier, connecting a bottom of the first semiconductor chip to thechip carrier through a first adhesive; Step 3: providing a first metalconnection connecting a top electrode of the first semiconductor chip tothe at least one of the plurality of the pins; Step 4: providing aplastic package for at least partially encapsulating the chip carrier,the pins, the first semiconductor chip and the metal connection; andStep 5: removing a bottom portion of the first groove so as toelectrically isolate the at least one of the plurality of the pins fromthe chip carrier.
 17. The semiconductor encapsulation method of claim16, wherein in Step 2 an excessive amount of the first adhesiveaccumulated at a bottom corner of the first groove near the chipcarrier.
 18. The semiconductor encapsulation method of claim 16, whereinthe step of providing a metal connection in Step 3 further comprisesconnecting a first end a first metal clip to a top electrode of thefirst semiconductor chip and a second end of the first metal clip to theat least one of the plurality of the pins, wherein the second end of thefirst metal clip being disposed inside the first groove.
 19. Thesemiconductor encapsulation method of claim 16 wherein in Step 1 thechip carrier is provided with a second groove on an upper surface of thechip carrier dividing the chip carrier into a first chip mounting areaand a second chip mounting area.
 20. The semiconductor encapsulationmethod of claim 19 wherein in Step 2 the first semiconductor chipdisposed on the first chip mounting area with a bottom electrode mountedonto the first chip mounting area through a conductive adhesive, anexcessive amount of the conductive adhesive accumulates at a bottomcorner of the first groove near the first chip mounting area.
 21. Thesemiconductor encapsulation method of claim 20 wherein Step 2 furthercomprises disposing a second semiconductor chip having a plurality oftop electrodes on the second chip mounting area, with a bottom mountedonto the second chip mounting area through a second adhesive, wherein anexcessive amount of second adhesive accumulated at a bottom corner ofthe second groove near the second chip mounting area.
 22. Thesemiconductor encapsulation method of claim 21 wherein Step 3 furtherprovides a second metal connection comprising a metal clip with a firstend connecting to a top electrode of the second chip and a second enddisposed inside the second groove.
 23. The semiconductor encapsulationmethod of claim 19 wherein Step 5 further comprises a step of removing abottom of the second groove so as to electrically isolate the first chipmounting area from the second chip mounting area, wherein a width of thesecond groove bottom removed is substantially smaller than a width ofthe second groove.
 24. A metal clip semiconductor encapsulation methodcomprises the following steps: Step 1: providing a lead frame comprisinga chip carrier and a plurality of pins; the chip carrier is providedwith a first groove open from a top surface of the lead frame to a depthshallower than a thickness of the lead frame dividing the chip carrierinto a first chip mounting area and a second chip mounting area; thepins are arranged in adjacent to the chip carrier; Step 2: disposing afirst semiconductor chip having a bottom electrode and a plurality oftop electrodes on the first chip mounting area with its bottom electrodemounted onto the first chip mounting area through a first adhesive,wherein an excessive amount of the first adhesive accumulated at abottom corner of the first groove near the first chip mounting area;disposing a second semiconductor chip having a bottom electrode and aplurality of top electrodes on the second chip mounting area with itsbottom electrode mounted onto the second chip mounting area through asecond adhesive; Step 3: providing a first metal clip having a first endand a second end, connecting the first end of the first metal clip ontoa top electrode of the first semiconductor chip and the second end ofthe first metal clip to the second chip mounting area, wherein thesecond end of the first metal clip disposed inside the first groove;Step 4: providing a plastic package for encapsulating the chip carrier,the pins, the first and second chips and the first metal clip; and Step5: removing a bottom of the first groove so as to electrically isolatethe first chip mounting area from the second chip mounting area, whereina width of the first groove bottom removed is substantially smaller thana width of the first groove.
 25. The metal clip semiconductorencapsulation method of claim 24, wherein Step 2 further comprising astep of accumulating an excessive amount of the first adhesive at abottom corner of the first groove near the first chip mounting area. 26.The metal clip semiconductor encapsulation method of claim 24 wherein inStep 1 the lead frame is provided with a second groove disposed betweenthe chip carrier and at least one of the plurality of the pins; whereinStep 3 further comprising a step of providing a second metal clip with afirst end and a second end, wherein the first end of the second metalclip connecting to a top electrode of the second semiconductor chip andthe second end of the second metal clip electrically connecting to theat least one of the plurality of the pins, wherein the second end of thesecond metal clip being disposed within the second groove.
 27. The metalclip semiconductor encapsulation method of claim 26 wherein Step 5further comprises a step of removing a bottom of the second groove so asto electrically isolate the at least one of the plurality of the pinsfrom the chip carrier, wherein a width of the second groove bottomremoved being substantially smaller than a width of the second groove.